Measurement of hyperfine coupling constants of muoniated radicals in small molecule semiconductors

Schulz, L., Wang, K., Willis, M. et al. (8 more authors) (2014) Measurement of hyperfine coupling constants of muoniated radicals in small molecule semiconductors. Journal of Physics: Conference Series, 551. 012042. ISSN 1742-6588

Abstract

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Authors/Creators:
  • Schulz, L.
  • Wang, K.
  • Willis, M.
  • Nuccio, L.
  • Murahari, P.
  • Zhang, S.
  • Pratt, F.L.
  • Lord, J.S.
  • Morley, N.A.
  • Bernhard, C.
  • Drew, A.J.
Copyright, Publisher and Additional Information: Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
Dates:
  • Published: 2014
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 18 Feb 2015 15:49
Last Modified: 18 Feb 2015 15:49
Published Version: http://dx.doi.org/10.1088/1742-6596/551/1/012042
Status: Published
Publisher: Institute of Physics Publishing
Refereed: Yes
Identification Number: https://doi.org/10.1088/1742-6596/551/1/012042

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