Surface mapping of field-induced piezoelectric strain at elevated temperature employing full-field interferometry

Stevenson, T, Quast, T, Bartl, G et al. (2 more authors) (2015) Surface mapping of field-induced piezoelectric strain at elevated temperature employing full-field interferometry. IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, 62 (1). 88 - 96. ISSN 0885-3010

Abstract

Metadata

Authors/Creators:
  • Stevenson, T
  • Quast, T
  • Bartl, G
  • Schmitz-Kempen, T
  • Weaver, PM
Keywords: Light interferometry; Piezoelectric actuators; Piezoelectricity
Dates:
  • Published: 1 January 2015
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering (Leeds) > School of Chemical & Process Engineering (Leeds) > Institute for Materials Research (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 02 Mar 2015 11:18
Last Modified: 03 Nov 2016 11:39
Published Version: http://dx.doi.org/10.1109/TUFFC.2014.006683
Status: Published
Publisher: Institute of Electrical and Electronics Engineers Inc.
Identification Number: https://doi.org/10.1109/TUFFC.2014.006683

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