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Measurement of Nonplanar Dielectric Samples Using an Open Resonator

Chan, W.F.P. and Chambers, B. (1987) Measurement of Nonplanar Dielectric Samples Using an Open Resonator. IEEE Transactions on Microwave Theory and Techniques, 35 (12). pp. 1429-1434. ISSN 0018-9480

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Abstract

Conventional microwave methods for measuring permittivity often utilize samples in flat sheet form. In practice, however, it is sometimes desirable to measure samples having curved surfaces, for example, parts of lenses or small radomes. This paper describes an open resonator technique for achieving this and compares measurements made at 11.6 GHz on samples of polymethyl methacryIate in both curved and flat sheet form.

Item Type: Article
Copyright, Publisher and Additional Information: Copyright © 1987 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Keywords: microwaves, resonators, dielectric constants, measurement, polymethyl methacrylate
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Sherpa Assistant
Date Deposited: 07 Dec 2005
Last Modified: 08 Feb 2013 16:48
Status: Published
Refereed: Yes
URI: http://eprints.whiterose.ac.uk/id/eprint/809

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