Subangstrom edge relaxations probed by electron microscopy in hexagonal boron nitride

Alem, N, Ramasse, QM, Seabourne, CR et al. (7 more authors) (2012) Subangstrom edge relaxations probed by electron microscopy in hexagonal boron nitride. Physical Review Letters, 109 (20). 205502. ISSN 0031-9007

Abstract

Metadata

Authors/Creators:
  • Alem, N
  • Ramasse, QM
  • Seabourne, CR
  • Yazyev, OV
  • Erickson, K
  • Sarahan, MC
  • Kisielowski, C
  • Scott, AJ
  • Louie, SG
  • Zettl, A
Copyright, Publisher and Additional Information: © 2012, American Physical Society. This is an author produced version of a paper published in Physical Review Letters. Uploaded in accordance with the publisher's self-archiving policy.
Dates:
  • Published: 16 November 2012
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering (Leeds) > School of Chemical & Process Engineering (Leeds) > Institute for Materials Research (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 16 Sep 2013 09:26
Last Modified: 15 Sep 2014 03:05
Published Version: http://link.aps.org/doi/10.1103/PhysRevLett.109.20...
Status: Published
Publisher: American Physical Society
Refereed: Yes
Identification Number: https://doi.org/10.1103/PhysRevLett.109.205502

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