Determination of the copper layer thickness in spin valves by grazing incidence x-ray fluorescence

Hase, T.P.A., Tanner, B.K., Ryan, P., Marrows, C.H. and Hickey, B.J. (1998) Determination of the copper layer thickness in spin valves by grazing incidence x-ray fluorescence. IEEE Transactions on Magnetics, 34 (4 (Par). pp. 831-833. ISSN 0018-9464

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Abstract

We show that at the standard laboratory wavelength of CuKα the scattering factors of Cu and Ni(-0.8)Fe(-0.2) are identical, thereby making it impossible to distinguish the boundary of the Cu spacer layer in a Cdpermalloy spin valve structure from grazing incidence x-ray reflectivity curves. Use of grazing incidence fluorescence, in conjunction with x-ray reflectivity provides sufficient information to control the Cu layer thickness. We demonstrate the technique on two spin valves with Cu spacer layers differing in thickness by a factor of 2.5.

Item Type:	Article
Copyright, Publisher and Additional Information:	Copyright © 1998 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Keywords:	x-ray grazing incidence fluorescence, spin valves
Academic Units:	The University of Leeds > Faculty of Maths and Physical Sciences (Leeds) > School of Physics and Astronomy (Leeds)
Depositing User:	Sherpa Assistant
Date Deposited:	10 Oct 2005
Last Modified:	08 Feb 2013 17:02
Published Version:	http://dx.doi.org/10.1109/20.706271
Status:	Published
Refereed:	Yes
Identification Number:	10.1109/20.706271
URI:	http://eprints.whiterose.ac.uk/id/eprint/728

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