Hase, T.P.A., Tanner, B.K., Ryan, P., Marrows, C.H. and Hickey, B.J. (1998) Determination of the copper layer thickness in spin valves by grazing incidence x-ray fluorescence. IEEE Transactions on Magnetics, 34 (4 (Par). pp. 831-833. ISSN 0018-9464
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We show that at the standard laboratory wavelength of CuKα the scattering factors of Cu and Ni(-0.8)Fe(-0.2) are identical, thereby making it impossible to distinguish the boundary of the Cu spacer layer in a Cdpermalloy spin valve structure from grazing incidence x-ray reflectivity curves. Use of grazing incidence fluorescence, in conjunction with x-ray reflectivity provides sufficient information to control the Cu layer thickness. We demonstrate the technique on two spin valves with Cu spacer layers differing in thickness by a factor of 2.5.
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|Keywords:||x-ray grazing incidence fluorescence, spin valves|
|Institution:||The University of Leeds|
|Academic Units:||The University of Leeds > Faculty of Maths and Physical Sciences (Leeds) > School of Physics and Astronomy (Leeds)|
|Depositing User:||Sherpa Assistant|
|Date Deposited:||10 Oct 2005|
|Last Modified:||05 Jun 2014 07:40|