Collantes, J.M., Pollard, R.D. and Sayed, M. (2002) Effects of DUT mismatch on the noise figure characterization: A comparative analysis of two Y-factor techniques. IEEE Transactions on Instrumentation and Measurement, 51 (6). pp. 1150-1156. ISSN 0018-9456
Available under licence : See the attached licence file.
Device mismatch seriously degrades accuracy in noise figure characterization. The suitability of corrections to the gain definitions for a more precise noise figure evaluation for mismatched devices is investigated and compared to classical techniques. The effects of device mismatch on the noise figure of the noise-meter receiver and its impact on the final accuracy are analyzed.
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|Keywords:||microwave characterization, noise figure, noise measurements, noise temperature, vector corrections, Y-factor technique|
|Institution:||The University of Leeds|
|Academic Units:||The University of Leeds > Faculty of Engineering (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Institute of Microwaves and Photonics (Leeds)|
|Depositing User:||Sherpa Assistant|
|Date Deposited:||10 Oct 2005|
|Last Modified:||06 Jun 2014 14:02|