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Effects of DUT mismatch on the noise figure characterization: A comparative analysis of two Y-factor techniques

Collantes, J.M., Pollard, R.D. and Sayed, M. (2002) Effects of DUT mismatch on the noise figure characterization: A comparative analysis of two Y-factor techniques. IEEE Transactions on Instrumentation and Measurement, 51 (6). pp. 1150-1156. ISSN 0018-9456

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Device mismatch seriously degrades accuracy in noise figure characterization. The suitability of corrections to the gain definitions for a more precise noise figure evaluation for mismatched devices is investigated and compared to classical techniques. The effects of device mismatch on the noise figure of the noise-meter receiver and its impact on the final accuracy are analyzed.

Item Type: Article
Copyright, Publisher and Additional Information: Copyright © 2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Keywords: microwave characterization, noise figure, noise measurements, noise temperature, vector corrections, Y-factor technique
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Institute of Microwaves and Photonics (Leeds)
Depositing User: Sherpa Assistant
Date Deposited: 10 Oct 2005
Last Modified: 06 Jun 2014 14:02
Published Version: http://dx.doi.org/10.1109/TIM.2002.808015
Status: Published
Refereed: Yes
Identification Number: 10.1109/TIM.2002.808015
URI: http://eprints.whiterose.ac.uk/id/eprint/723

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