Effects of DUT mismatch on the noise figure characterization: A comparative analysis of two Y-factor techniques

Collantes, J.M., Pollard, R.D. and Sayed, M. (2002) Effects of DUT mismatch on the noise figure characterization: A comparative analysis of two Y-factor techniques. IEEE Transactions on Instrumentation and Measurement, 51 (6). pp. 1150-1156. ISSN 0018-9456

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Authors/Creators:
  • Collantes, J.M.
  • Pollard, R.D.
  • Sayed, M.
Copyright, Publisher and Additional Information: Copyright © 2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Keywords: microwave characterization, noise figure, noise measurements, noise temperature, vector corrections, Y-factor technique
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Institute of Microwaves and Photonics (Leeds)
Depositing User: Sherpa Assistant
Date Deposited: 10 Oct 2005
Last Modified: 17 Sep 2016 00:09
Published Version: http://dx.doi.org/10.1109/TIM.2002.808015
Status: Published
Refereed: Yes
Identification Number: 10.1109/TIM.2002.808015

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