Hoyle, B.S. (2005) A schema for generic process tomography sensors. IEEE Sensors Journal, 5 (2). pp. 117-124. ISSN 1530-437XFull text available as:
Available under License : See the attached licence file.
A schema is introduced that aims to facilitate the widespread exploitation of the science of process tomography (PT) that promises a unique multidimensional sensing opportunity. Although PT has been developed to an advanced state, applications have been laboratory or pilot-plant based, configured on an end-to-end basis, and limited typically to the formation of images that attempt to represent process contents. The schema facilitates the fusion of multidimensional internal process state data in terms of a model that yields directly usable process information, either for design model confirmation or for effective plant monitoring or control, here termed a reality visualization model (RVM). A generic view leads to a taxonomy of process types and their respective RVM. An illustrative example is included and a review of typical sensor system components is given.
|Copyright, Publisher and Additional Information:||Copyright © 2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.|
|Academic Units:||The University of Leeds > Faculty of Engineering (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Institute of Integrated Information Systems (Leeds)|
|Depositing User:||Repository Officer|
|Date Deposited:||28 Sep 2005|
|Last Modified:||08 Feb 2013 17:02|
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