Hoyle, B.S. (2005) A schema for generic process tomography sensors. IEEE Sensors Journal, 5 (2). pp. 117-124. ISSN 1530-437X
Available under licence : See the attached licence file.
A schema is introduced that aims to facilitate the widespread exploitation of the science of process tomography (PT) that promises a unique multidimensional sensing opportunity. Although PT has been developed to an advanced state, applications have been laboratory or pilot-plant based, configured on an end-to-end basis, and limited typically to the formation of images that attempt to represent process contents. The schema facilitates the fusion of multidimensional internal process state data in terms of a model that yields directly usable process information, either for design model confirmation or for effective plant monitoring or control, here termed a reality visualization model (RVM). A generic view leads to a taxonomy of process types and their respective RVM. An illustrative example is included and a review of typical sensor system components is given.
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|Institution:||The University of Leeds|
|Academic Units:||The University of Leeds > Faculty of Engineering (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Institute of Integrated Information Systems (Leeds)|
|Depositing User:||Repository Officer|
|Date Deposited:||28 Sep 2005|
|Last Modified:||23 Apr 2015 16:39|