Probabilistic uncertainty analysis of an FRF of a structure using a Gaussian process emulator

Fricker, Thomas E., Oakley, Jeremy E., Sims, Neil D. and Worden, Keith (2011) Probabilistic uncertainty analysis of an FRF of a structure using a Gaussian process emulator. Mechanical Systems and Signal Processing. ISSN 0888-3270 (In Press)

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Abstract

This paper introduces methods for probabilistic uncertainty analysis of a frequency response function (FRF) of a structure obtained via a finite element (FE) model. The methods are applicable to computationally expensive FE models, making use of a Bayesian metamodel known as an emulator. The emulator produces fast predictions of the FE model output, but also accounts for the additional uncertainty induced by only having a limited number of model evaluations. Two approaches to the probabilistic uncertainty analysis of FRFs are developed. The first considers the uncertainty in the response at discrete frequencies, giving pointwise uncertainty intervals. The second considers the uncertainty in an entire FRF across a frequency range, giving an uncertainty envelope function. The methods are demonstrated and compared to alternative approaches in a practical case study.

Item Type:	Article
Copyright, Publisher and Additional Information:	© 2011 Elsevier. This is an author produced version of a paper accepted for publication in Mechanical Systems and Signal Processing. Uploaded in accordance with the publisher's self-archiving policy
Keywords:	Finite element model, Probabilistic uncertainty analysis, Envelope frequency response function, Gaussian process, Metamodel, Bayesian
Academic Units:	The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Mechanical Engineering (Sheffield) The University of Sheffield > Faculty of Science (Sheffield) > School of Mathematics and Statistics (Sheffield)
Depositing User:	Dr Neil D Sims
Date Deposited:	05 Sep 2011 10:15
Last Modified:	08 Feb 2013 17:33
Published Version:	http://dx.doi.org/10.1016/j.ymssp.2011.06.013
Status:	In Press
Publisher:	Elsevier
Refereed:	Yes
URI:	http://eprints.whiterose.ac.uk/id/eprint/43225

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