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General Optimality of the Heisenberg Limit for Quantum Metrology

Zwierz, Marcin, Perez-Delgado, Carlos A. and Kok, Pieter (2010) General Optimality of the Heisenberg Limit for Quantum Metrology. Physical Review Letters, 105 (18). p. 180402.


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Quantum metrology promises improved sensitivity in parameter estimation over classical procedures. However, there is a debate over the question of how the sensitivity scales with the resources and the number of queries that are used in estimation procedures. Here, we reconcile the physical definition of the relevant resources used in parameter estimation with the information-theoretical scaling in terms of the query complexity of a quantum network. This leads to a completely general optimality proof of the Heisenberg limit for quantum metrology. We give an example of how our proof resolves paradoxes that suggest sensitivities beyond the Heisenberg limit, and we show that the Heisenberg limit is an information-theoretic interpretation of the Margolus-Levitin bound, rather than Heisenberg’s uncertainty relation.

Item Type: Article
Keywords: Quantum Metrology, Heisenberg limit, Heisenberg Uncertainty relation
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Science (Sheffield) > Department of Physics and Astronomy (Sheffield)
Depositing User: Dr Pieter Kok
Date Deposited: 24 Jun 2011 13:47
Last Modified: 15 Sep 2014 03:57
Published Version: http://dx.doi.org/10.1103/PhysRevLett.105.180402
Status: Published
Publisher: American Journal of Physics
Refereed: Yes
Identification Number: 10.1103/PhysRevLett.105.180402
Related URLs:
URI: http://eprints.whiterose.ac.uk/id/eprint/43097

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