General Optimality of the Heisenberg Limit for Quantum Metrology

Zwierz, Marcin, Perez-Delgado, Carlos A. and Kok, Pieter (2010) General Optimality of the Heisenberg Limit for Quantum Metrology. Physical Review Letters, 105 (18). p. 180402.

Abstract

Metadata

Authors/Creators:
  • Zwierz, Marcin
  • Perez-Delgado, Carlos A.
  • Kok, Pieter
Keywords: Quantum Metrology, Heisenberg limit, Heisenberg Uncertainty relation
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Science (Sheffield) > Department of Physics and Astronomy (Sheffield)
Depositing User: Dr Pieter Kok
Date Deposited: 24 Jun 2011 13:47
Last Modified: 15 Sep 2014 03:57
Published Version: http://dx.doi.org/10.1103/PhysRevLett.105.180402
Status: Published
Publisher: American Journal of Physics
Refereed: Yes
Identification Number: DOI:10.1103/PhysRevLett.105.180402
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Filename: 1004.3944v3.pdf

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