How good are your testers? An assessment of testing ability

Huang, Liang, Thomson, Christopher and Holcombe, Mike (2007) How good are your testers? An assessment of testing ability. In: Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION, 2007. TAICPART-MUTATION 2007, 12-14 September 2007, Windsor, UK.

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Authors/Creators:
  • Huang, Liang
  • Thomson, Christopher (c.thomson@dcs.shef.ac.uk)
  • Holcombe, Mike
Copyright, Publisher and Additional Information: © Copyright 2007 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Computer Science (Sheffield)
Depositing User: Dr Christopher D Thomson
Date Deposited: 04 Mar 2008 18:13
Last Modified: 24 Jun 2014 17:16
Published Version: http://dx.doi.org/10.1109/TAICPART.2007.4344103
Status: Published
Refereed: Yes

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Filename: 04344103.pdf

Description: IEEE published article

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