Comparison between the in-plane anisotropies and magnetostriction constants of thin epitaxial Fe films grown on GaAs and Ga0.8In0.2As substrates, with Cr overlayers

Morley, N.A., Gibbs, M.R.J., Ahmad, E., Will, I.G. and Xu, Y.B. (2006) Comparison between the in-plane anisotropies and magnetostriction constants of thin epitaxial Fe films grown on GaAs and Ga0.8In0.2As substrates, with Cr overlayers. Journal of Applied Physics, 99 (8). Art no. 08N508. ISSN 1089-7550

Abstract

Metadata

Authors/Creators:
  • Morley, N.A.
  • Gibbs, M.R.J.
  • Ahmad, E.
  • Will, I.G.
  • Xu, Y.B.
Copyright, Publisher and Additional Information: © 2006 American Institute of Physics. Available from the author's web site (Associated URL field).
Keywords:
Institution: The University of Sheffield, The University of York
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield)
The University of York > Electronics (York)
Depositing User: Repository Officer
Date Deposited: 08 Jan 2007
Last Modified: 05 Aug 2007 18:25
Published Version: http://dx.doi.org/10.1063/1.2158974
Status: Published
Publisher: American Institute of Physics
Refereed: Yes
Identification Number: 10.1063/1.2158974
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