XPS and XMCD study of Fe3O4/GaAs interface

Lu, Y X, Claydon, J S, Ahmad, E et al. (4 more authors) (2005) XPS and XMCD study of Fe3O4/GaAs interface. IEEE Transactions on Magnetics. pp. 2808-2810. ISSN 1941-0069



Copyright, Publisher and Additional Information: © 2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Keywords: half-metallic Fe3O4,post-growth oxidation,spintronics,XMCD,SPIN INJECTION,SEMICONDUCTOR,OXIDATION
Institution: The University of York
Academic Units: The University of York > Electronics (York)
The University of York > Physics (York)
Depositing User: Repository Officer
Date Deposited: 18 Dec 2006
Last Modified: 06 Feb 2017 11:32
Published Version: http://dx.doi.org/10.1109/TMAG.2005.854834
Status: Published
Refereed: Yes


Filename: xuyb6.pdf

Description: xuyb6.pdf

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