White Rose University Consortium logo
University of Leeds logo University of Sheffield logo York University logo

Moving toward an atomistic reader model

Boerner, E.D., Chubykalo-Fesenko, O.A., Chantrell, R.W., Heinonen, O. and Mryasov, O.N. (2005) Moving toward an atomistic reader model. IEEE TRANSACTIONS ON MAGNETICS. pp. 936-940. ISSN 0018-9464

Full text available as:
[img]
Preview
Text (chantrellrw7.pdf)
chantrellrw7.pdf

Download (244Kb)

Abstract

With the move to recording densities up to and beyond 1 Tb/in/sup 2/, the size of read elements is continually reducing as a requirement of the scaling process. The expectation is for read elements containing magnetic films as thin as 1.5 nm, in which finite size effects, and factors such as interface mixing might be expected to become of increasing importance. Here, we review the limitations of the current (micromagnetic) approach to the theoretical modeling of thin films and develop an atomistic multiscale model capable of investigating the magnetic properties at the atomic level. Finite-size effects are found to be significant, suggesting the need for models beyond the micromagnetic approach to support the development of future read sensors.

Item Type: Article
Copyright, Publisher and Additional Information: © 2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Keywords: atomistic calculations, computational modeling, read elements
Academic Units: The University of York > Physics (York)
Depositing User: Repository Officer
Date Deposited: 18 Dec 2006
Last Modified: 17 Oct 2013 14:23
Published Version: http://dx.doi.org/10.1109/TMAG.2004.842128
Status: Published
Refereed: Yes
Related URLs:
URI: http://eprints.whiterose.ac.uk/id/eprint/1840

Actions (login required)

View Item View Item