Evans, C.A., Jovanovic, V.D., Indjin, D., Ikonic, Z. and Harrison, P. (2006) Investigation of thermal effects in quantum-cascade lasers. IEEE Journal of Quantum Electronics, 42 (9). pp. 859-867. ISSN 0018-9197
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Abstract
The development of a thermal model for quantum cascade lasers (QCLs) is presented. The model is used in conjunction with a self-consistent scattering rate calculation of the electron dynamics of an InGaAs-AlAsSb QCL to calculate the temperature distribution throughout the device which can be a limiting factor for high temperature operation. The model is used to investigate the effects of various driving conditions and device geometries, such as epilayer down bonding and buried heterostructures, on the active region temperature. It is found that buried heterostructures have a factor of eight decrease in thermal time constants compared to standard ridge waveguide structures in pulsed mode and allow a /spl sim/78% increase in heat sink temperature compared to epilayer down mounted devices in continuous-wave mode. The model presented provides a valuable tool for understanding the thermal dynamics inside a quantum cascade laser and will help to improve their operating temperatures.
| Item Type: | Article |
|---|---|
| Copyright, Publisher and Additional Information: | Copyright © 2006 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. |
| Keywords: | Electron dynamics, quantum-cascade lasers (QCLs), thermal modeling |
| Academic Units: | The University of Leeds > Faculty of Engineering (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Institute of Microwaves and Photonics (Leeds) |
| Depositing User: | Repository Officer |
| Date Deposited: | 24 Oct 2006 |
| Last Modified: | 08 Feb 2013 17:02 |
| Published Version: | http://dx.doi.org/10.1109/JQE.2006.880116 |
| Status: | Published |
| Publisher: | IEEE |
| Refereed: | Yes |
| Identification Number: | 10.1109/JQE.2006.880116 |
| URI: | http://eprints.whiterose.ac.uk/id/eprint/1648 |
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