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Investigation of thermal effects in quantum-cascade lasers

Evans, C.A., Jovanovic, V.D., Indjin, D., Ikonic, Z. and Harrison, P. (2006) Investigation of thermal effects in quantum-cascade lasers. IEEE Journal of Quantum Electronics, 42 (9). pp. 859-867. ISSN 0018-9197

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The development of a thermal model for quantum cascade lasers (QCLs) is presented. The model is used in conjunction with a self-consistent scattering rate calculation of the electron dynamics of an InGaAs-AlAsSb QCL to calculate the temperature distribution throughout the device which can be a limiting factor for high temperature operation. The model is used to investigate the effects of various driving conditions and device geometries, such as epilayer down bonding and buried heterostructures, on the active region temperature. It is found that buried heterostructures have a factor of eight decrease in thermal time constants compared to standard ridge waveguide structures in pulsed mode and allow a /spl sim/78% increase in heat sink temperature compared to epilayer down mounted devices in continuous-wave mode. The model presented provides a valuable tool for understanding the thermal dynamics inside a quantum cascade laser and will help to improve their operating temperatures.

Item Type: Article
Copyright, Publisher and Additional Information: Copyright © 2006 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Keywords: Electron dynamics, quantum-cascade lasers (QCLs), thermal modeling
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Institute of Microwaves and Photonics (Leeds)
Depositing User: Repository Officer
Date Deposited: 24 Oct 2006
Last Modified: 05 Jun 2014 04:20
Published Version: http://dx.doi.org/10.1109/JQE.2006.880116
Status: Published
Publisher: IEEE
Refereed: Yes
Identification Number: 10.1109/JQE.2006.880116
URI: http://eprints.whiterose.ac.uk/id/eprint/1648

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