X-ray mapping in a scanning transmission electron microscope of InGaAs quantum dots with embedded fractional monolayers of aluminium

Walther, T. orcid.org/0000-0003-3571-6263, Nutter, J., Reithmaier, J.P. et al. (1 more author) (2020) X-ray mapping in a scanning transmission electron microscope of InGaAs quantum dots with embedded fractional monolayers of aluminium. Semiconductor Science and Technology, 35 (8). 084001. ISSN 0268-1242

Abstract

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Authors/Creators:
Copyright, Publisher and Additional Information: © 2020 The Authors. As the Version of Record of this article is going to be / has been published on a gold open access basis under a CC BY 3.0 licence, this Accepted Manuscript is available for reuse under a CC BY 3.0 licence immediately, (https://creativecommons.org/licenses/by/3.0/).
Dates:
  • Accepted: 23 April 2020
  • Published (online): 23 April 2020
  • Published: 23 June 2020
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield)
Funding Information:
FunderGrant number
Engineering and Physical Sciences Research CouncilEP/P02470X/1
Engineering and Physical Sciences Research CouncilEP/P025285/1
Engineering and Physical Sciences Research CouncilEP/S019367/1
Engineering and Physical Sciences Research CouncilEP/R00661X/1
Depositing User: Symplectic Sheffield
Date Deposited: 04 May 2020 08:57
Last Modified: 23 Nov 2021 13:07
Status: Published
Publisher: IOP Publishing
Refereed: Yes
Identification Number: https://doi.org/10.1088/1361-6641/ab8c52

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