Improved ambient stability of thermally annealed zinc nitride thin films

Trapalis, A. orcid.org/0000-0003-4887-7058, Farrer, I. orcid.org/0000-0002-3033-4306, Kennedy, K. et al. (3 more authors) (2020) Improved ambient stability of thermally annealed zinc nitride thin films. AIP Advances, 10 (3). 035018.

Abstract

Metadata

Authors/Creators:
Copyright, Publisher and Additional Information: © 2020 The Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
Dates:
  • Accepted: 26 February 2020
  • Published (online): 13 March 2020
  • Published: 13 March 2020
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 21 Apr 2020 13:40
Last Modified: 20 Jul 2020 09:07
Status: Published
Publisher: AIP Publishing
Refereed: Yes
Identification Number: https://doi.org/10.1063/1.5144054
Related URLs:

Share / Export

Statistics