Luo, P., Ekkanath Madathil, S.N., Nishizawa, S. et al. (1 more author) (2020) Dynamic avalanche free design in 1.2kV Si-IGBTs for ultra high current density operation. In: Proceedings of 2019 IEEE International Electron Devices Meeting (IEDM). 65th IEEE International Electron Devices Meeting (IEDM), 07-11 Dec 2019, San Francisco, CA, USA. Institute of Electrical and Electronics Engineers (IEEE) , 12.3.1-12.3.4. ISBN 9781728140339
Abstract
Dynamic Avalanche (DA) phenomenon poses a fundamental limit on the operating current density, turn-off power loss as well as reliability of MOS-bipolar devices. Overcoming this phenomenon is essential to ensure their safe operation in emerging electric transport. In this work, detailed analysis of 1.2 kV trench gated IGBTs are undertaken through experiments and calibrated TCAD simulations to show the fundamental cause of the DA as well as a method to achieve DA free design for ultra-high current density operation and reliability in 1.2 kV Si-IGBTs.
Metadata
Item Type: | Proceedings Paper |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. Reproduced in accordance with the publisher's self-archiving policy. |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Funding Information: | Funder Grant number Engineering and Physical Science Research Council (EPSRC) N/A |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 20 Nov 2019 09:48 |
Last Modified: | 13 Feb 2021 01:38 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
Refereed: | Yes |
Identification Number: | 10.1109/IEDM19573.2019.8993596 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:153668 |