Effect level based parameterization method for diffuse scattering models at millimeter-wave frequencies

Tian, H., Liao, X., Wang, Y. et al. (4 more authors) (2019) Effect level based parameterization method for diffuse scattering models at millimeter-wave frequencies. IEEE Access, 7. pp. 93286-93293. ISSN 2169-3536

Abstract

Metadata

Authors/Creators:
  • Tian, H.
  • Liao, X.
  • Wang, Y.
  • Shao, Y.
  • Zhou, J.
  • Hu, T.
  • Zhang, J.
Copyright, Publisher and Additional Information: © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. Reproduced in accordance with the publisher's self-archiving policy.
Keywords: Millimeter-wave; diffuse scattering; model parameterization; effect level; propagation coefficients; rough materials
Dates:
  • Accepted: 30 June 2019
  • Published (online): 10 July 2019
  • Published: 10 July 2019
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 13 Nov 2019 11:34
Last Modified: 13 Nov 2019 11:34
Status: Published
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Refereed: Yes
Identification Number: https://doi.org/10.1109/access.2019.2927612
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