A study of the nanostructure and hardness of electron beam evaporated TiAlBN coatings

Baker, M.A., Monclus, M.A., Rebholz, C. et al. (3 more authors) (2010) A study of the nanostructure and hardness of electron beam evaporated TiAlBN coatings. Thin Solid Films, 518 (15). pp. 4273-4280. ISSN 0040-6090

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Authors/Creators:
Copyright, Publisher and Additional Information: © 2010 Elsevier B.V. This is an author produced version of a paper subsequently published in Thin Solid Films. Uploaded in accordance with the publisher's self-archiving policy. Article available under the terms of the CC-BY-NC-ND licence (https://creativecommons.org/licenses/by-nc-nd/4.0/).
Keywords: Nanocomposites; Thin films; Hardness; TiAlBN; X-ray photoelectron spectroscopy; X-ray diffraction; Transmission electron microscopy
Dates:
  • Accepted: 22 December 2009
  • Published (online): 11 January 2010
  • Published: 31 May 2010
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 18 Nov 2019 14:31
Last Modified: 20 Nov 2019 14:48
Status: Published
Publisher: Elsevier
Refereed: Yes
Identification Number: https://doi.org/10.1016/j.tsf.2009.12.109

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