Shi, Y., Wang, J. and Wang, B. (2020) Electromagnetic-thermal coupled simulation under various fault conditions of a triple redundant 9-phase PMASynRM. IEEE Transactions on Industry Applications, 56 (1). pp. 128-137. ISSN 0093-9994
Abstract
This paper performs electromagnetic (EM) and thermal coupled simulation based on 2D transient electromagnetic and 3D thermal model of a triple redundant 9-phase permanent magnet-assisted synchronous reluctance motor (PMASynRM) under various fault conditions at different speeds. The coupled simulation process is controlled by a scripting file. The resultant temperatures under EM-thermal coupled simulation will be comprehensively compared with those under thermal-only simulation. The predicted current waveforms under fault conditions by the 2D EM model and predicted temperatures by the 3D thermal model will be compared with the test results for validation. The outcomes of the study not only gives a better understanding of the thermal behavior, but also provides a guidance to the necessity of the EM-thermal coupled simulation under different fault conditions as well as to determination of the maximum permissible fault detection time before permanent damage due to the fault may occur.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. Reproduced in accordance with the publisher's self-archiving policy. |
Keywords: | Permanent magnet-assisted synchronous reluctance motor; EM-thermal coupled simulation; fault condition; temperature distribution; detection time; resistance limited; reactance limited |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 17 Oct 2019 08:20 |
Last Modified: | 17 Dec 2021 08:06 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
Refereed: | Yes |
Identification Number: | 10.1109/tia.2019.2946116 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:152252 |