Local structural analysis of erbium-doped tellurite modified silica glass with x-ray photoelectron spectroscopy

Kamil, SA, Chandrappan, J, Portoles, J et al. (2 more authors) (2019) Local structural analysis of erbium-doped tellurite modified silica glass with x-ray photoelectron spectroscopy. Materials Research Express, 6 (8). ARTN 086220. ISSN 2053-1591

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Copyright, Publisher and Additional Information: © 2019 IOP Publishing Ltd. This is an author produced version of a paper published in Materials Research Express. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: x-ray photoelectron spectroscopy; ultrafast lasers; laser ablation; optical materials; Er3+ doped glasses
Dates:
  • Published: August 2019
  • Accepted: 11 June 2019
  • Published (online): 19 June 2019
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering (Leeds) > School of Chemical & Process Engineering (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 18 Jul 2019 10:59
Last Modified: 18 Jul 2019 12:23
Status: Published
Publisher: IOP Publishing
Identification Number: https://doi.org/10.1088/2053-1591/ab28eb
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Embargoed until: 19 June 2020

Filename: Suraya Ahmad Kamil_MRE_2.pdf

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