Electric field enhancement in ceramic capacitors due to interface amplitude roughness

Heath, J.P., Harding, J.H. orcid.org/0000-0001-8429-3151, Sinclair, D.C. orcid.org/0000-0002-8031-7678 et al. (1 more author) (2018) Electric field enhancement in ceramic capacitors due to interface amplitude roughness. Journal of the European Ceramic Society. ISSN 0955-2219

Abstract

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Authors/Creators:
Copyright, Publisher and Additional Information: © 2018 Elsevier. This is an author produced version of a paper subsequently published in Journal of the European Ceramic Society. Uploaded in accordance with the publisher's self-archiving policy. Article available under the terms of the CC-BY-NC-ND licence (https://creativecommons.org/licenses/by-nc-nd/4.0/).
Keywords: FEM; Interface; MLCC; Dielectric; Simulation
Dates:
  • Accepted: 31 October 2018
  • Published (online): 2 November 2018
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield)
Funding Information:
FunderGrant number
ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL (EPSRC)EP/L017563/1
Depositing User: Symplectic Sheffield
Date Deposited: 19 Nov 2018 12:51
Last Modified: 19 Nov 2018 12:51
Published Version: https://doi.org/10.1016/j.jeurceramsoc.2018.10.033
Status: Published online
Publisher: Elsevier
Refereed: Yes
Identification Number: https://doi.org/10.1016/j.jeurceramsoc.2018.10.033

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