Applications of x-ray Raman scattering for in-situ material charecterization

Mishra, B (2017) Applications of x-ray Raman scattering for in-situ material charecterization. In: 253rd National Meeting of the American-Chemical-Society (ACS) on Advanced Materials, Technologies, Systems, and Processes, 02-06 Apr 2017, San Francisco, CA.

Metadata

Authors/Creators:
  • Mishra, B
Dates:
  • Published: 2 April 2017
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering (Leeds) > School of Chemical & Process Engineering (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 12 Nov 2018 09:20
Last Modified: 12 Nov 2018 09:20
Status: Published
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