Electron energy loss spectroscopic profiling of semiconductor hetero- and nano-structures: theory, implementation, applications

Walther, T. orcid.org/0000-0003-3571-6263 (2003) Electron energy loss spectroscopic profiling of semiconductor hetero- and nano-structures: theory, implementation, applications. In: Cullis, A.G. and Midgley, P.A., (eds.) Microscopy of Semiconducting Materials 2003. Microscopy of Semiconducting Materials, 31 Mar - 03 Apr 2003, Cambridge, UK. CRC Press , pp. 27-32. ISBN 9781315895536

Abstract

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Authors/Creators:
Copyright, Publisher and Additional Information: © 2003 CRC Press.
Keywords: ELS; Microscope; Diffusion; Lengths; Shifts
Dates:
  • Published: 2003
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 02 Nov 2018 12:37
Last Modified: 02 Nov 2018 12:37
Status: Published
Publisher: CRC Press
Refereed: Yes

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