Self-consistent absorption correction for quantifying very noisy X-ray maps: group III nitride nanowires as an example

Wang, X., Bai, J. and Walther, T. orcid.org/0000-0003-3571-6263 (2018) Self-consistent absorption correction for quantifying very noisy X-ray maps: group III nitride nanowires as an example. Journal of Microscopy, 272 (2). pp. 111-122. ISSN 0022-2720

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Copyright, Publisher and Additional Information: © 2018 The Authors / Royal Microscopical Society. This is an author produced version of a paper subsequently published in Journal of Microscopy. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: Absorption; InGaN; X-ray mapping; k-factor; nanowire
Dates:
  • Accepted: 1 August 2018
  • Published (online): 21 August 2018
  • Published: November 2018
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 19 Oct 2018 14:40
Last Modified: 19 Oct 2018 14:40
Published Version: https://doi.org/10.1111/jmi.12751
Status: Published
Publisher: Wiley
Refereed: Yes
Identification Number: https://doi.org/10.1111/jmi.12751
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Filename: Wang_EpistarNanowires_v4d_corrected+figures.pdf

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