Structure and properties of a model conductive filament/host oxide interface in HfO2-based ReRAM

Padilha, A. C. M. and McKenna, K. P. orcid.org/0000-0003-0975-3626 (2018) Structure and properties of a model conductive filament/host oxide interface in HfO2-based ReRAM. PHYSICAL REVIEW MATERIALS. 45001. ISSN 2475-9953

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Authors/Creators:
Copyright, Publisher and Additional Information: © 2018, The Author(s).
Dates:
  • Published: 6 April 2018
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Physics (York)
Depositing User: Pure (York)
Date Deposited: 09 Jul 2018 16:20
Last Modified: 02 May 2020 23:20
Published Version: https://doi.org/10.1103/PhysRevMaterials.2.045001
Status: Published
Refereed: Yes
Identification Number: https://doi.org/10.1103/PhysRevMaterials.2.045001

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Filename: PhysRevMaterials.2.045001.pdf

Description: PhysRevMaterials.2.045001

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