Padilha, A. C. M. and McKenna, K. P. orcid.org/0000-0003-0975-3626 (2018) Structure and properties of a model conductive filament/host oxide interface in HfO2-based ReRAM. PHYSICAL REVIEW MATERIALS. 45001. ISSN 2475-9953
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2018, The Author(s). | ||||||
Dates: |
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Institution: | The University of York | ||||||
Academic Units: | The University of York > Faculty of Sciences (York) > Physics (York) | ||||||
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Depositing User: | Pure (York) | ||||||
Date Deposited: | 09 Jul 2018 16:20 | ||||||
Last Modified: | 08 Jan 2024 00:15 | ||||||
Published Version: | https://doi.org/10.1103/PhysRevMaterials.2.045001 | ||||||
Status: | Published | ||||||
Refereed: | Yes | ||||||
Identification Number: | https://doi.org/10.1103/PhysRevMaterials.2.045001 |