High-speed large area atomic force microscopy using a quartz resonator

Wang, J.-Y., Mullin, N. and Hobbs, J.K. (2018) High-speed large area atomic force microscopy using a quartz resonator. Nanotechnology, 29 (33). 335502. ISSN 0957-4484

Abstract

Metadata

Authors/Creators:
  • Wang, J.-Y.
  • Mullin, N.
  • Hobbs, J.K.
Copyright, Publisher and Additional Information: This is an author-created, un-copyedited version of an article published in Nanotechnology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at https://doi.org/10.1088/1361-6528/aac7a3.
Keywords: AFM; high speed scanning; scan area
Dates:
  • Published: 11 June 2018
  • Accepted: 24 May 2018
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Science (Sheffield) > Department of Physics and Astronomy (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 23 Jul 2018 11:56
Last Modified: 11 Jun 2019 00:42
Published Version: https://doi.org/10.1088/1361-6528/aac7a3
Status: Published
Publisher: IOP Publishing
Refereed: Yes
Identification Number: https://doi.org/10.1088/1361-6528/aac7a3
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