High-speed large area atomic force microscopy using a quartz resonator
Wang, J.-Y., Mullin, N. and Hobbs, J.K.
(2018)
High-speed large area atomic force microscopy using a quartz resonator.
Nanotechnology, 29 (33).
335502.
ISSN 0957-4484
Abstract
A high-speed atomic force microscope for scanning large areas, utilizing a quartz bar driven close to resonance to provide the motion in the fast scan axis is presented. Images up to 170 × 170 μm2 have been obtained on a polydimethylsiloxane (PDMS) grating in 1 s. This is provided through an average tip-sample velocity of 28 cm s−1 at a line rate of 830 Hz. Scan areas up to 80 × 80 μm2 have been obtained in 0.42 s with a line rate of 1410 Hz. To demonstrate the capability of the scanner the spherulitic crystallization of a semicrystalline polymer was imaged in situ at high speed.
Metadata
Item Type:
Article
Authors/Creators:
Wang, J.-Y.
Mullin, N.
Hobbs, J.K.
Copyright, Publisher and Additional Information:
This is an author-created, un-copyedited version of an article published in Nanotechnology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at https://doi.org/10.1088/1361-6528/aac7a3.
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