A comparison of He and Ne FIB imaging of cracks in microindented silicon nitride

Baggott, A., Mazaheri, M., Zhou, Y. et al. (2 more authors) (2018) A comparison of He and Ne FIB imaging of cracks in microindented silicon nitride. Materials Characterization, 141. pp. 362-369. ISSN 1044-5803

Abstract

Metadata

Authors/Creators:
Copyright, Publisher and Additional Information: © 2018 The Authors. Published by Elsevier Inc. This is an open access article under the CC BY license (http://creativecommons.org/licenses/BY/4.0/).
Dates:
  • Accepted: 2 May 2018
  • Published (online): 3 May 2018
  • Published: July 2018
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield)
Funding Information:
FunderGrant number
LEVERHULME TRUST (THE)IN-2016-027
SKF B.V.URMS 145478
Depositing User: Symplectic Sheffield
Date Deposited: 05 Jun 2018 15:29
Last Modified: 06 Jun 2018 12:12
Published Version: https://doi.org/10.1016/j.matchar.2018.05.006
Status: Published
Publisher: Elsevier
Refereed: Yes
Identification Number: https://doi.org/10.1016/j.matchar.2018.05.006

Share / Export

Statistics