System identification-based frequency domain feature extraction for defect detection and characterization

Li, P., Lang, Z., Zhao, L. et al. (4 more authors) (2018) System identification-based frequency domain feature extraction for defect detection and characterization. NDT & E International, 98. pp. 70-79. ISSN 0963-8695

Abstract

Metadata

Authors/Creators:
  • Li, P.
  • Lang, Z.
  • Zhao, L.
  • Tian, G.
  • Neasham, J.A.
  • Zhang, J.
  • Graham, D.J.
Copyright, Publisher and Additional Information: © 2018 Elsevier. This is an author produced version of a paper subsequently published in NDT & E International. Uploaded in accordance with the publisher's self-archiving policy. Article available under the terms of the CC-BY-NC-ND licence (https://creativecommons.org/licenses/by-nc-nd/4.0/).
Keywords: Defect detection; Feature extraction; Frequency response function; Structure health monitoring; System identification
Dates:
  • Accepted: 12 April 2018
  • Published (online): 19 April 2018
  • Published: September 2018
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Automatic Control and Systems Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 09 May 2018 15:00
Last Modified: 26 Nov 2020 09:23
Status: Published
Publisher: Elsevier
Refereed: Yes
Identification Number: https://doi.org/10.1016/j.ndteint.2018.04.008

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