Large exchange bias induced by polycrystalline Mn3Ga antiferromagnetic films with controlled layer thickness

Wu, Haokaifeng, Sudoh, Iori, Xu, Ruihan et al. (5 more authors) (2018) Large exchange bias induced by polycrystalline Mn3Ga antiferromagnetic films with controlled layer thickness. Journal of Physics D: Applied Physics. 215003. ISSN 1361-6463

Abstract

Metadata

Authors/Creators:
Copyright, Publisher and Additional Information: © 2018 IOP Publishing Ltd.
Dates:
  • Published: 12 April 2018
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Electronic Engineering (York)
The University of York > Faculty of Sciences (York) > Physics (York)
Depositing User: Pure (York)
Date Deposited: 13 Apr 2018 11:10
Last Modified: 20 Jul 2019 23:52
Published Version: https://doi.org/10.1088/1361-6463/aabd8e
Status: Published
Refereed: Yes
Identification Number: https://doi.org/10.1088/1361-6463/aabd8e

Download

Filename: 794769_0_art_file_10437772_5zgydn_resubmission.docx

Description: 794769_0_art_file_10437772_5zgydn_resubmission

Share / Export

Statistics