New perspectives on nano-engineering by secondary electron spectroscopy in the helium ion and scanning electron microscope

Stehling, N.A., Masters, R., Zhou, Y. et al. (4 more authors) (2018) New perspectives on nano-engineering by secondary electron spectroscopy in the helium ion and scanning electron microscope. MRS Communications. ISSN 2159-6867

Abstract

Metadata

Authors/Creators:
Copyright, Publisher and Additional Information: © 2018 Materials Research Society. This is an author produced version of a paper subsequently published in MRS Communications. Article available under the terms of the CC-BY-NC-ND license (https://creativecommons.org/licenses/by-nc-nd/4.0/).
Dates:
  • Accepted: 8 February 2018
  • Published (online): 23 April 2018
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield)
Funding Information:
FunderGrant number
Engineering and Physical Science Research CouncilEP/K005693/1; EP/N008065/1
Depositing User: Symplectic Sheffield
Date Deposited: 01 Mar 2018 12:18
Last Modified: 19 May 2020 10:22
Published Version: https://doi.org/10.1557/mrc.2018.75
Status: Published online
Publisher: Cambridge University Press (CUP)
Refereed: Yes
Identification Number: https://doi.org/10.1557/mrc.2018.75

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