In Situ Scanning Transmission Electron Microscopy of Ni Nanoparticle Redispersion via the Reduction of Hollow NiO

LaGrow, Alec, Lloyd, David Carlos, Gai, Pratibha L orcid.org/0000-0003-3837-7148 et al. (1 more author) (2018) In Situ Scanning Transmission Electron Microscopy of Ni Nanoparticle Redispersion via the Reduction of Hollow NiO. Chemistry of Materials. pp. 197-203. ISSN 1520-5002

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Copyright, Publisher and Additional Information: © 2017 American Chemical Society. This is an author-produced version of the published paper. Uploaded in accordance with the publisher’s self-archiving policy. Further copying may not be permitted; contact the publisher for details
Keywords: In situ ESTEM, Nanoparticles redispersion reduction ,redispersion ,reduction
Dates:
  • Published: 9 January 2018
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Physics (York)
The University of York > Faculty of Sciences (York) > Chemistry (York)
The University of York > Faculty of Sciences (York) > Electronic Engineering (York)
The University of York > Faculty of Sciences (York) > The York JEOL Nanocentre
Depositing User: Pure (York)
Date Deposited: 29 Jan 2018 17:30
Last Modified: 20 Jul 2019 23:38
Published Version: https://doi.org/10.1021/acs.chemmater.7b04184
Status: Published
Refereed: Yes
Identification Number: https://doi.org/10.1021/acs.chemmater.7b04184

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Description: Nickel_oxidation_and_reduction_

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