Image feature delocalization in defocused probe electron ptychography

Cao, S., Maiden, A. and Rodenburg, J.M. orcid.org/0000-0002-1059-8179 (2018) Image feature delocalization in defocused probe electron ptychography. Ultramicroscopy, 187. pp. 71-83. ISSN 0304-3991

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Copyright, Publisher and Additional Information: © 2018 Elsevier. This is an author produced version of a paper subsequently published in Ultramicroscopy. Uploaded in accordance with the publisher's self-archiving policy. Article available under the terms of the CC-BY-NC-ND licence (https://creativecommons.org/licenses/by-nc-nd/4.0/).
Dates:
  • Published: April 2018
  • Published (online): 31 January 2018
  • Accepted: 12 January 2018
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 26 Jan 2018 16:17
Last Modified: 31 Jan 2019 01:38
Published Version: https://doi.org/10.1016/j.ultramic.2018.01.006
Status: Published
Publisher: Elsevier
Refereed: Yes
Identification Number: https://doi.org/10.1016/j.ultramic.2018.01.006

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