Atomic-Resolution Spectrum Imaging of Semiconductor Nanowires

Zamani, RR, Hage, FS, Lehmann, S et al. (2 more authors) (2018) Atomic-Resolution Spectrum Imaging of Semiconductor Nanowires. Nano Letters, 18 (3). pp. 1557-1563. ISSN 1530-6984

Abstract

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Authors/Creators:
Copyright, Publisher and Additional Information: © 2017, American Chemical Society. This is an author produced version of a paper published in Nano Letters. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: aberration-corrected STEM; atomic-resolution EELS; GaSb−InAs; heterointerface; III−V nanowire; spectrum imaging
Dates:
  • Published: 14 March 2018
  • Accepted: 8 November 2017
  • Published (online): 8 November 2017
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering (Leeds) > School of Chemical & Process Engineering (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 19 Dec 2017 09:57
Last Modified: 08 Nov 2018 01:39
Status: Published
Publisher: American Chemical Society
Identification Number: https://doi.org/10.1021/acs.nanolett.7b03929

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