Optical ptychography with extended depth of field

Li, P. and Maiden, A. orcid.org/0000-0002-8192-8235 (2017) Optical ptychography with extended depth of field. In: Journal of Physics: Conference Series. Electron Microscopy and Analysis Group Conference 2017 (EMAG2017), 03-06 Jul 2017, Manchester, UK. Institute of Physics

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Item Type: Proceedings Paper
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Content from this work may be used under the terms of theCreative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. Published under licence by IOP Publishing Ltd
Dates:
  • Published: 16 October 2017
  • Published (online): 16 October 2017
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 20 Dec 2017 12:01
Last Modified: 20 Dec 2017 12:01
Published Version: https://doi.org/10.1088/1742-6596/902/1/012015
Status: Published
Publisher: Institute of Physics
Refereed: Yes
Identification Number: 10.1088/1742-6596/902/1/012015
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