Comparative study of image contrast in scanning electron microscope and helium ion microscope

O'Connell, R., Chen, Y., Zhang, H. orcid.org/0000-0002-1188-7810 et al. (5 more authors) (2017) Comparative study of image contrast in scanning electron microscope and helium ion microscope. Journal of Microscopy, 268 (3). pp. 313-320. ISSN 0022-2720

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Authors/Creators:
Copyright, Publisher and Additional Information: This is the peer reviewed version of the following article: O'CONNELL, R., CHEN, Y., ZHANG, H., ZHOU, Y., FOX, D., MAGUIRE, P., WANG, J.J. and RODENBURG, C. (2017), Comparative study of image contrast in scanning electron microscope and helium ion microscope. Journal of Microscopy, 268: 313–320, which has been published in final form at https://doi.org/10.1111/jmi.12660. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Self-Archiving.
Keywords: Charging effect; contrast reversal; helium ion microscope; scanning electron microscope; secondary electrons
Dates:
  • Published: December 2017
  • Accepted: 2 October 2017
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield)
Funding Information:
FunderGrant number
ROYAL SOCIETYIE140211
ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL (EPSRC)EP/N008065/1
Depositing User: Symplectic Sheffield
Date Deposited: 29 Nov 2017 14:51
Last Modified: 20 Nov 2018 01:38
Published Version: https://doi.org/10.1111/jmi.12660
Status: Published
Publisher: Wiley
Refereed: Yes
Identification Number: https://doi.org/10.1111/jmi.12660
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