Time-frequency extraction of sample thickness and spectroscopic parameters using THz TDS

Greenall, NR, Wood, CD orcid.org/0000-0003-1679-5410, Li, LH orcid.org/0000-0003-4998-7259 et al. (4 more authors) (2017) Time-frequency extraction of sample thickness and spectroscopic parameters using THz TDS. In: 2017 42nd International Conference on Infrared, Millimeter, and Terahertz Waves. 42nd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 27 Aug - 01 Sep 2017, Cancun, Mexico. IEEE . ISBN 978-1-5090-6050-4

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Copyright, Publisher and Additional Information: © 2017 IEEE. This is an author produced version of a paper published in 2017 42nd International Conference on Infrared, Millimeter, and Terahertz Waves . Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: Transfer functions, Interferometers, Refractive index, Calibration, Time-domain analysis, Spectroscopy, Resonant frequency
Dates:
  • Published: 12 October 2017
  • Accepted: 3 July 2017
  • Published (online): 16 October 2017
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Maths and Physical Sciences (Leeds) > School of Chemistry (Leeds) > Physical Chemistry (Leeds)
Funding Information:
FunderGrant number
EPSRCEP/I026657/1
EPSRCEP/P007449/1
Depositing User: Symplectic Publications
Date Deposited: 28 Nov 2017 13:03
Last Modified: 29 Mar 2018 13:35
Status: Published
Publisher: IEEE
Identification Number: https://doi.org/10.1109/IRMMW-THz.2017.8066976

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