Abrams, K.J. orcid.org/0000-0002-2789-7204, Wan, Q., Stehling, N. et al. (4 more authors) (2017) Nanoscale mapping of semi-crystalline polypropylene. In: Physica Status Solidi (C). European Materials Research Society Spring 2017, 22-26 May 2017, Strasbourg, France. Wiley .
Abstract
We reveal nanoscale information of semi-crystalline polypropyl-ene with the use of a new secondary electron hyperspectral imag-ing technique. The innovative combination of cryo-SEM and low voltage allows for the optimised imaging of these beam-sensitive materials. Through the collection of secondary electron hyper-spectral imaging data mapping of molecular order on the nano-scale in the scanning electron microscope (SEM) can be achieved.
Metadata
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Copyright, Publisher and Additional Information: | © Wiley 2017. This is an author-produced version of a paper accepted for publication in physica status solidi (c). Uploaded in accordance with the publisher's self-archiving policy | ||||
Keywords: | Secondary electron spectroscopy; semi-crystalline polymers; hyperspectral imaging; polypropylene | ||||
Dates: |
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Institution: | The University of Sheffield | ||||
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield) | ||||
Funding Information: |
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Depositing User: | Symplectic Sheffield | ||||
Date Deposited: | 10 Nov 2017 12:50 | ||||
Last Modified: | 22 Nov 2018 01:38 | ||||
Published Version: | https://doi.org/10.1002/pssc.201700153 | ||||
Status: | Published | ||||
Publisher: | Wiley | ||||
Refereed: | Yes | ||||
Identification Number: | https://doi.org/10.1002/pssc.201700153 |