Abrams, K.J. orcid.org/0000-0002-2789-7204, Wan, Q., Stehling, N. et al. (4 more authors) (2017) Nanoscale mapping of semi-crystalline polypropylene. In: Physica Status Solidi (C). European Materials Research Society Spring 2017, 22-26 May 2017, Strasbourg, France. Wiley
Abstract
We reveal nanoscale information of semi-crystalline polypropyl-ene with the use of a new secondary electron hyperspectral imag-ing technique. The innovative combination of cryo-SEM and low voltage allows for the optimised imaging of these beam-sensitive materials. Through the collection of secondary electron hyper-spectral imaging data mapping of molecular order on the nano-scale in the scanning electron microscope (SEM) can be achieved.
Metadata
Item Type: | Proceedings Paper |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © Wiley 2017. This is an author-produced version of a paper accepted for publication in physica status solidi (c). Uploaded in accordance with the publisher's self-archiving policy |
Keywords: | Secondary electron spectroscopy; semi-crystalline polymers; hyperspectral imaging; polypropylene |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield) |
Funding Information: | Funder Grant number ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL (EPSRC) EP/N008065/1 |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 10 Nov 2017 12:50 |
Last Modified: | 22 Nov 2018 01:38 |
Published Version: | https://doi.org/10.1002/pssc.201700153 |
Status: | Published |
Publisher: | Wiley |
Refereed: | Yes |
Identification Number: | 10.1002/pssc.201700153 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:123871 |