Determination of the lateral size and thickness of solution-processed graphene flakes

We present a method to determine the lateral size distribution of solution–processed graphene via direct image analysis techniques. Initially transmission electron microscopy (TEM) and optical microscopy (OM) were correlated and used to provide a reliable benchmark. A rapid, automated OM method was then developed to obtain the distribution from thousands of flakes, avoiding statistical uncertainties and providing high accuracy. Dynamic light scattering (DLS) was further employed to develop an in-situ method to derive the number particle size distribution (PSD) for a dispersion, with a deviation lower than 22% in the sub-micron regime. Methods for determining flake thickness are also discussed.