Mapping Nanostructural Variations in Silk by Secondary Electron Hyperspectral Imaging

Wan, Q., Abrams, K., Masters, R. et al. (5 more authors) (2017) Mapping Nanostructural Variations in Silk by Secondary Electron Hyperspectral Imaging. Advanced Materials. ISSN 0935-9648

Abstract

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Authors/Creators:
Copyright, Publisher and Additional Information: © 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim This is an open access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0/), which permits use, distribution and reproduction in any medium, provided the original work is properly cited.
Dates:
  • Accepted: 15 September 2017
  • Published (online): 8 November 2017
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield)
Funding Information:
FunderGrant number
ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL (EPSRC)EP/K005693/1
Depositing User: Symplectic Sheffield
Date Deposited: 19 Oct 2017 14:31
Last Modified: 31 Oct 2018 13:22
Published Version: https://doi.org/10.1002/adma.201703510
Status: Published online
Publisher: Wiley
Refereed: Yes
Identification Number: https://doi.org/10.1002/adma.201703510

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