Giblin, S.P., See, P., Petrie, A. et al. (6 more authors) (2016) High-resolution error detection in the capture process of a single-electron pump. Applied Physics Letters, 108 (2). 023502. ISSN 0003-6951
Abstract
The dynamic capture of electrons in a semiconductor quantum dot (QD) by raising a potential barrier is a crucial stage in metrological quantized charge pumping. In this work, we use a quantum point contact (QPC) charge sensor to study errors in the electron capture process of a QD formed in a GaAs heterostructure. Using a two-step measurement protocol to compensate for 1/f noise in the QPC current, and repeating the protocol more than 106 times, we are able to resolve errors with probabilities of order 106. For the studied sample, one-electron capture is affected by errors in 30 out of every million cycles, while two-electron capture was performed more than 106 times with only one error. For errors in one-electron capture, we detect both failure to capture an electron and capture of two electrons. Electron counting measurements are a valuable tool for investigating non-equilibrium charge capture dynamics, and necessary for validating the metrological accuracy of semiconductor electron pumps.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2016 AIP Publishing. Reproduced in accordance with the publisher's self-archiving policy. |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 11 Oct 2017 15:31 |
Last Modified: | 11 Oct 2017 15:36 |
Published Version: | https://doi.org/10.1063/1.4939250 |
Status: | Published |
Publisher: | AIP Publishing |
Refereed: | Yes |
Identification Number: | 10.1063/1.4939250 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:122277 |