Effective absorption correction for energy dispersive X-ray mapping in a scanning transmission electron microscope: analyzing the local indium distribution in rough samples of InGaN alloy layers

Wang, X., Chauvat, M.P., Ruterana, P. et al. (1 more author) (2017) Effective absorption correction for energy dispersive X-ray mapping in a scanning transmission electron microscope: analyzing the local indium distribution in rough samples of InGaN alloy layers. Journal of Microscopy, 268 (3). pp. 248-253. ISSN 0022-2720

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Authors/Creators:
Copyright, Publisher and Additional Information: © 2017 The Authors / Royal Microscopical Society This is an author produced version of a paper subsequently published in Journal of Microscopy. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: Absorption correction; energy-dispersive X-ray spectroscopy (EDXS); indium gallium nitride (InGaN); islanding; transmission electron microscopy (TEM); X-ray microanalysis
Dates:
  • Accepted: 1 September 2017
  • Published (online): 28 September 2017
  • Published: December 2017
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 07 Sep 2017 12:40
Last Modified: 28 Sep 2018 00:38
Published Version: https://doi.org/10.1111/jmi.102643
Status: Published
Publisher: Wiley
Refereed: Yes
Identification Number: https://doi.org/10.1111/jmi.102643

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