Uncertainty-Driven Black-Box Test Data Generation

Walkinshaw, N. and Fraser, G. (2017) Uncertainty-Driven Black-Box Test Data Generation. In: Proceedings of 2017 IEEE International Conference on Software Testing, Verification and Validation (ICST). 2017 IEEE International Conference on Software Testing, Verification and Validation (ICST), 13-17 Mar 2017, Tokyo, Japan. IEEE , pp. 253-263.

Abstract

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Authors/Creators:
  • Walkinshaw, N.
  • Fraser, G.
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Dates:
  • Published (online): 18 May 2017
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Computer Science (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 22 Aug 2017 11:02
Last Modified: 19 Dec 2022 13:36
Published Version: https://doi.org/10.1109/ICST.2017.30
Status: Published
Publisher: IEEE
Refereed: Yes
Identification Number: https://doi.org/10.1109/ICST.2017.30
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