Robust Interfacial Exchange Bias and Metal-Insulator Transition Influenced by the LaNiO3 Layer Thickness in La0.7Sr0.3MnO3/LaNiO3 Superlattices

Zhou, Guowei, Song, Cheng, Bai, Yuhao et al. (6 more authors) (2017) Robust Interfacial Exchange Bias and Metal-Insulator Transition Influenced by the LaNiO3 Layer Thickness in La0.7Sr0.3MnO3/LaNiO3 Superlattices. ACS applied materials & interfaces. pp. 3156-3160. ISSN 1944-8252

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Copyright, Publisher and Additional Information: © 2017, American Chemical Society. This is an author-produced version of the published paper. Uploaded in accordance with the publisher’s self-archiving policy. Further copying may not be permitted; contact the publisher for details.
Keywords: Journal Article
Dates:
  • Published: 25 January 2017
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Electronic Engineering (York)
Depositing User: Pure (York)
Date Deposited: 14 Jun 2017 11:45
Last Modified: 19 Jul 2019 23:32
Published Version: https://doi.org/10.1021/acsami.6b14372
Status: Published
Refereed: Yes
Identification Number: https://doi.org/10.1021/acsami.6b14372

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Filename: ACS_2017_LaSrMnO.pdf

Description: ACS, 2017, LaSrMnO

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