Single-atom spectroscopy of phosphorus dopants implanted into graphene

Susi, T, Hardcastle, TP, Hofsäss, H et al. (7 more authors) (2017) Single-atom spectroscopy of phosphorus dopants implanted into graphene. 2D Materials, 4 (2). 021013. ISSN 2053-1583



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Keywords: electron energy loss spectroscopy, heteroatom doping, ion implantation, scanning transmission electron microscopy, density functional theory
  • Published: June 2017
  • Accepted: 6 February 2017
  • Published (online): 17 February 2017
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering (Leeds) > School of Chemical & Process Engineering (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 11 Apr 2017 14:48
Last Modified: 05 Oct 2017 15:39
Published Version:
Status: Published
Publisher: IOP Publishing
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