Single-atom spectroscopy of phosphorus dopants implanted into graphene

Susi, T, Hardcastle, TP, Hofsäss, H et al. (7 more authors) (2017) Single-atom spectroscopy of phosphorus dopants implanted into graphene. 2D Materials, 4 (2). 021013. ISSN 2053-1583

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Copyright, Publisher and Additional Information: (c) 2017 IOP Publishing Ltd. Original content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence [https://creativecommons.org/licenses/by/3.0/]. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
Keywords: electron energy loss spectroscopy, heteroatom doping, ion implantation, scanning transmission electron microscopy, density functional theory
Dates:
  • Published: June 2017
  • Accepted: 6 February 2017
  • Published (online): 17 February 2017
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering (Leeds) > School of Chemical & Process Engineering (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 11 Apr 2017 14:48
Last Modified: 05 Oct 2017 15:39
Published Version: https://doi.org/10.1088/2053-1583/aa5e78
Status: Published
Publisher: IOP Publishing
Identification Number: https://doi.org/10.1088/2053-1583/aa5e78
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