Characterizing a spatial light modulator using ptychography

Ptychography is used to characterize the phase response of a spatial light modulator (SLM). We use the technique to measure and correct the optical curvature and the gamma curve of the device. Ptychography’s unique ability to extend field of view is then employed to test performance by mapping the phase profile generated by a test image to subpixel resolution over the entire active region of the SLM.