Structural, electrical, and optical characterization of as grown and oxidized zinc nitride thin films

Trapalis, A., Heffernan, J., Farrer, I. et al. (2 more authors) (2016) Structural, electrical, and optical characterization of as grown and oxidized zinc nitride thin films. Journal of Applied Physics, 120 (20). 205102. ISSN 0021-8979

Abstract

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Authors/Creators:
  • Trapalis, A. (http://orcid.org/0000-0003-4887-7058)
  • Heffernan, J.
  • Farrer, I. (http://orcid.org/0000-0002-3033-4306)
  • Sharman, J.
  • Kean, A.
Copyright, Publisher and Additional Information: © 2016 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
Dates:
  • Published: 28 November 2016
  • Published (online): 28 November 2016
  • Accepted: 10 November 2016
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 08 Dec 2016 13:35
Last Modified: 08 Dec 2016 13:38
Published Version: https://doi.org/10.1063/1.4968545
Status: Published
Publisher: AIP Publishing
Refereed: Yes
Identification Number: https://doi.org/10.1063/1.4968545

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