Preface of 19 th Microscopy of Semiconducting Materials conference

Walther, T. and Beanland, R. (2016) Preface of 19 th Microscopy of Semiconducting Materials conference. Journal of Microscopy, 262 (2). pp. 131-133. ISSN 0022-2720


Copyright, Publisher and Additional Information: © 2016 Wiley. This is an author produced version of a paper subsequently published in Journal of Microscopy. Uploaded in accordance with the publisher's self-archiving policy.
  • Published: May 2016
  • Accepted: 28 January 2016
  • Published (online): 14 April 2016
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 16 Nov 2016 14:08
Last Modified: 14 Apr 2017 02:19
Published Version:
Status: Published
Publisher: Wiley
Refereed: Yes
Identification Number:

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