Preface of 19 th Microscopy of Semiconducting Materials conference

Walther, T. orcid.org/0000-0003-3571-6263 and Beanland, R. (2016) Preface of 19 th Microscopy of Semiconducting Materials conference. Journal of Microscopy, 262 (2). pp. 131-133. ISSN 0022-2720

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Copyright, Publisher and Additional Information: © 2016 Wiley. This is an author produced version of a paper subsequently published in Journal of Microscopy. Uploaded in accordance with the publisher's self-archiving policy.
Dates:
  • Published: May 2016
  • Accepted: 28 January 2016
  • Published (online): 14 April 2016
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 16 Nov 2016 14:08
Last Modified: 14 Apr 2017 02:19
Published Version: http://dx.doi.org/10.1111/jmi.12391
Status: Published
Publisher: Wiley
Refereed: Yes
Identification Number: https://doi.org/10.1111/jmi.12391

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